論文読み

本・論文
  • IPM, f-div and binary classification
    • IPM and f-dvi: total variation distance
    • empirical computation of IPM: LP is available
    • uniform consistency and rate of convergence: standard approach based on Geer's book.
    • binary classificaiton and IPM: complexity of classifier <--> IPM <--> Risk (linear loss)
  • confliction of convexity and metric properties in f-div.
    • triangle ineq. on f-divergence leads a specific form for f.